The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2018
Filed:
Jul. 25, 2013
Applicant:
Inb Vision Ag, Magdeburg, DE;
Inventors:
Bernd Michaelis, Biederitz, DE;
Tilo Lilienblum, Magdeburg, DE;
Sebastian Von Enzberg, Magdeburg, DE;
Assignee:
INB Vision AG, Magdeburg, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 21/30 (2006.01); G01B 21/04 (2006.01); G01B 21/20 (2006.01); G06T 17/30 (2006.01);
U.S. Cl.
CPC ...
G01B 21/30 (2013.01); G01B 21/047 (2013.01); G01B 21/20 (2013.01); G06T 17/30 (2013.01);
Abstract
The invention relates to a method for detecting deviations of an object surface using a comparison between measured data of the surface and specified reference data. A surface description, at least portions of which are parametric, is generated as a target surface model using the specified reference data, and the comparison is carried out using the target surface model and the measured data. The invention likewise relates to a device for detecting deviations of an object surface using a comparison between measured data of the surface and specified reference data.