The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2018
Filed:
Apr. 12, 2017
Ford Global Technologies, Llc, Dearborn, MI (US);
Larry Paul Haack, Ann Arbor, MI (US);
Shannon Christine Bollin, South Lyon, MI (US);
Ann Marie Straccia, Southgate, MI (US);
Sabrina Louise Peczonczyk, Ann Arbor, MI (US);
Steven J. Simko, Shelby Township, MI (US);
Patricia Karen Konopka, Beverly Hills, MI (US);
Ford Global Technologies, LLC, Dearborn, MI (US);
Abstract
Methods and systems are disclosed for analyzing the adhesiveness of enamel frits using topography. One method includes analyzing a topography of a defined area of an enamel frit surface having a plurality of peaks and determining a topographical parameter of the defined area based on peak shape and/or density. The determined topographical parameter may be compared to a threshold value. The method may then include applying an adhesive to the enamel frit and bonding the enamel frit to a substrate if the determined topographical parameter is below the threshold value. The analysis of the topography may be performed using a non-contact profilometer, such as an optical profilometer. In one embodiment, the topographical parameter may be developed interfacial roughness (S). The method may be integrated into a manufacturing/assembly line for vehicle glass components, such as windshields or side windows.