The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 16, 2018

Filed:

Mar. 23, 2017
Applicant:

Carl Zeiss Meditec Ag, Jena, DE;

Inventors:

Christoph Hauger, Aalen, DE;

Markus Seesselberg, Aalen, DE;

Martin Hacker, Jena, DE;

Keith O'Hara, San Ramon, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/14 (2006.01); A61B 3/02 (2006.01); G02B 26/00 (2006.01); A61B 3/10 (2006.01); A61B 3/13 (2006.01); G01B 9/02 (2006.01); A61B 3/117 (2006.01); A61B 3/12 (2006.01); G02B 27/09 (2006.01); A61B 3/00 (2006.01); G02B 7/14 (2006.01);
U.S. Cl.
CPC ...
A61B 3/102 (2013.01); A61B 3/005 (2013.01); A61B 3/117 (2013.01); A61B 3/12 (2013.01); A61B 3/1225 (2013.01); A61B 3/13 (2013.01); A61B 3/14 (2013.01); G01B 9/0203 (2013.01); G01B 9/02004 (2013.01); G01B 9/02035 (2013.01); G01B 9/02044 (2013.01); G01B 9/02091 (2013.01); G02B 7/14 (2013.01); G02B 27/0955 (2013.01);
Abstract

Imaging systems are provided allowing examination of different object regions spaced apart in a depth direction by visual microscopy and by optical coherence tomography. An axial field of view and a lateral resolution is varied depending on which object region is examined by the imaging system. The proposed imaging systems are in particular applicable for thorough examination of the human eye.


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