The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 16, 2018

Filed:

Apr. 21, 2016
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Hiroto Tachikawa, Fujisawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01);
U.S. Cl.
CPC ...
A61B 3/102 (2013.01);
Abstract

Provided is an imaging apparatus, including: a light source which irradiates light that is frequency swept; an interference unit which diverges the irradiation light into irradiation light, which is to be irradiated on an object to be inspected, and reference light, to generate coherent light from reflected light of the irradiation light from the object to be inspected and the reference light; at least two conversion units which subject at least two analog signals, which are obtained by diverging an analog signal of the coherent light, to analog-to-digital conversion; an association unit which associates indices of at least two data arrays obtained by the analog-to-digital conversion; an integration unit which integrates the at least two data arrays based on the associated indices; and an image generating unit which generates an image of the object to be inspected based on a data array obtained by the integration.


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