The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 09, 2018
Filed:
Apr. 27, 2015
Hitachi, Ltd., Chiyoda-ku, Tokyo, JP;
Takashi Nakahara, Tokyo, JP;
Shinya Yuda, Tokyo, JP;
Takanori Aono, Tokyo, JP;
Tetsu Inahara, Tokyo, JP;
Yoshitaka Seki, Tokyo, JP;
Kouji Akita, Tokyo, JP;
Kiyomi Abe, Tokyo, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
A learning unit in learning mode generates a cluster from a cluster analysis of data formed from frequency constituent data and state data, obtained from a sensor unit. An abnormality calculation unit computes, as abnormalities, the minimum values among distances to surfaces of the clusters of the data formed from the frequency constituent data and the state data, obtained when in predictive fault indicator sensing mode. A predictive fault indicator determination unit determines a predictive fault indicator of an X-ray tube by comparing the abnormalities with a predetermined threshold.