The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 09, 2018
Filed:
Sep. 06, 2013
Applicant:
Sony Corporation, Tokyo, JP;
Inventors:
Sho Amano, Kanagawa, JP;
Tomoya Yamaura, Tokyo, JP;
Yasushi Katayama, Tokyo, JP;
Hideyuki Suzuki, Tokyo, JP;
Yoshihiko Ikenaga, Tokyo, JP;
Kimiya Kato, Tokyo, JP;
Assignee:
SONY CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 4/00 (2018.01); H04W 56/00 (2009.01); H04L 7/00 (2006.01); H04N 21/4223 (2011.01); H04N 21/442 (2011.01); H04N 21/4363 (2011.01); H04N 21/6379 (2011.01); H04B 17/364 (2015.01); H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
H04W 56/001 (2013.01); H04B 17/364 (2015.01); H04L 7/0041 (2013.01); H04L 43/0852 (2013.01); H04N 21/4223 (2013.01); H04N 21/43637 (2013.01); H04N 21/44209 (2013.01); H04N 21/44227 (2013.01); H04N 21/6379 (2013.01); H04W 56/00 (2013.01);
Abstract
A first device for processing data, the first device including at least one control circuit configured to adjust at least one parameter related to a delay time based on a measured value of the delay time. The measured value of the delay time is a difference between a first time associated with when the first device processes the data and a second time associated with when a second device processes the data.