The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 09, 2018

Filed:

Dec. 21, 2016
Applicant:

The United States of America As Represented BY the Administrator of the National Aeronautics and Space Administration, Washington, DC (US);

Inventors:

Sang Hyouk Choi, Poquoson, VA (US);

Adam J. Duzik, Yorktown, VA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/02 (2006.01); H01L 29/161 (2006.01); C30B 29/20 (2006.01); C30B 23/08 (2006.01); C30B 23/06 (2006.01); C30B 29/52 (2006.01);
U.S. Cl.
CPC ...
H01L 21/02532 (2013.01); C30B 23/063 (2013.01); C30B 23/08 (2013.01); C30B 29/20 (2013.01); C30B 29/52 (2013.01); H01L 21/0242 (2013.01); H01L 21/02598 (2013.01); H01L 29/161 (2013.01);
Abstract

Various embodiments may provide a low temperature (i.e., less than 850° C.) method of Silicon-Germanium (SiGe) on sapphire (AlO) (SiGe/sapphire) growth that may produce a single crystal film with less thermal loading effort to the substrate than conventional high temperature (i.e., temperatures above 850° C.) methods. The various embodiments may alleviate the thermal loading requirement of the substrate, which in conventional high temperature (i.e., temperatures above 850° C.) methods had surface temperatures within the range of 850° C.-900° C. The various embodiments may provide a new thermal loading requirement of the sapphire substrate for growing single crystal SiGe on the sapphire substrate in the range of about 450° C. to about 500° C.


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