The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 09, 2018

Filed:

Apr. 26, 2017
Applicant:

The Aerospace Corporation, El Segundo, CA (US);

Inventors:

Joseph T. Case, El Segundo, CA (US);

Shant Kenderian, El Segundo, CA (US);

Eric C. Johnson, El Segundo, CA (US);

Assignee:

The Aerospace Corporation, El Segundo, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 15/08 (2011.01); G01N 23/046 (2018.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
G06T 15/08 (2013.01); G01N 23/046 (2013.01); G06T 11/006 (2013.01); G06T 11/008 (2013.01); G01N 2223/401 (2013.01); G01N 2223/419 (2013.01); G06T 2207/10081 (2013.01); G06T 2211/424 (2013.01);
Abstract

A portable x-ray computed tomography (CT) system may utilize algebraic reconstruction techniques (ART) to produce 3D volume images from tens of shots or less. The system may be deployed as desired where x-ray source and detector positions are not known beforehand. A fast, accurate matrix may be formed relating voxels to detector pixels via a modified ray tracing algorithm, eliminating artifacts caused by approaches using rough approximations. Masking or recombination may be performed to remove detector pixels that are not part of a region of interest (ROI) or lump the pixels together as one unknown, significantly reducing matrix size, and hence, computation time. The positions and orientations of the x-ray source and detector may be treated as unknowns and refined to optimize a volume image metric. For example, the optimized metric could be image contrast, image sparsity, or total variation.


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