The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 09, 2018

Filed:

Sep. 14, 2012
Applicants:

Ika Bar-menachem, Herzelia, IL;

Oded Peer, Ranana, IL;

Inventors:

Ika Bar-Menachem, Herzelia, IL;

Oded Peer, Ranana, IL;

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 10/06 (2012.01);
U.S. Cl.
CPC ...
G06Q 10/06393 (2013.01);
Abstract

Methods and apparatus are provided for configuring the granularity of key performance indicators that are available from a monitored component. A granularity of a key performance indicator provided by a monitored component can be configured by creating a plurality of instances of a statistics collector object, wherein each instance of the statistics collector object collects information for a different context of the key performance indicator; updating an indicator value for a corresponding instance of the statistics collector object when an activity occurs for the context of the key performance indicator; and providing the indicator value for a given context of the key performance indicator to a monitoring object. The configurable granularity can be specified by the product, for example, using an application programming interface.


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