The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 09, 2018

Filed:

Nov. 28, 2016
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Songyun Duan, Pleasantville, NY (US);

Anastasios Kementsietsidis, New York, NY (US);

Wangchao Le, Salt Lake City, UT (US);

Feifei Li, Salt Lake City, UT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30469 (2013.01); G06F 17/30442 (2013.01); G06F 17/30598 (2013.01); G06F 17/30958 (2013.01); G06F 17/30463 (2013.01);
Abstract

Multiquery optimization is performed in the context of RDF/SPARQL. Heuristic algorithms partition an input batch of queries into groups such that each group of queries can be optimized together. The optimization incorporates an efficient algorithm to discover the common sub-structures of multiple SPARQL queries and an effective cost model to compare candidate execution plans. No assumptions are made about the underlying SPARQL query engine. This provides portability across different RDF stores.


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