The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 09, 2018
Filed:
Mar. 13, 2014
Sas Institute Inc., Cary, NC (US);
Christian Macaro, Raleigh, NC (US);
Jan Chvosta, Raleigh, NC (US);
Mark Roland Little, Cary, NC (US);
SAS Institute Inc., Cary, NC (US);
Abstract
Various embodiments are generally directed to techniques for producing statistically correct and efficient combinations of multiple simulated posterior samples from MCMC and related Bayesian sampling schemes are described. One or more chains from a Bayesian posterior distribution of values may be generated. It may be determine whether the one or more chains have reached stationarity through parallel processing on a plurality of processing nodes. Based upon the determination, each of the one or more chains that have reached stationarity through parallel processing on the plurality of processing nodes may be sorted. The one or more sorted chains may be resampled through parallel processing on the plurality of processing nodes. The one or more resampled chains may be combined. Other embodiments are described and claimed.