The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 09, 2018

Filed:

Nov. 28, 2017
Applicant:

Laurence H. Cooke, Los Gatos, CA (US);

Inventor:

Laurence H. Cooke, Los Gatos, CA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/00 (2013.01); G06F 12/14 (2006.01); G06F 12/0875 (2016.01); G06F 12/0811 (2016.01); G06F 9/30 (2018.01); G06F 21/52 (2013.01); G06F 21/75 (2013.01); G06F 21/85 (2013.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 12/1408 (2013.01); G06F 9/30178 (2013.01); G06F 12/0811 (2013.01); G06F 12/0875 (2013.01); G06F 21/52 (2013.01); G06F 21/75 (2013.01); G06F 21/85 (2013.01); G06F 2212/1052 (2013.01); G06F 2212/283 (2013.01); G06F 2212/402 (2013.01); G06F 2212/452 (2013.01); G06F 2221/2125 (2013.01);
Abstract

Techniques and logic are presented for encrypting and decrypting applications and related data within a multi-processor system to prevent tampering. The decryption and encryption may be performed either between a system bus and a processor's individual L1 cache memory or between a processor's instruction and execution unit and their respective L1 caches. The logic may include one or more linear feedback shift registers (LFSRs) that may be used for generation of unique sequential address related codes to perform the decryption of instructions and transformation logic that may be used for generation of equivalent offset address related codes to perform decryption and encryption of data. The logic may also be programmable and may be used for test purposes.


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