The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 09, 2018

Filed:

Jan. 24, 2014
Applicant:

Hitachi, Ltd., Chiyoda-ku, Tokyo, JP;

Inventors:

Tadanobu Toba, Tokyo, JP;

Kenichi Shimbo, Tokyo, JP;

Yusuke Kanno, Tokyo, JP;

Nobuyasu Kanekawa, Tokyo, JP;

Kotaro Shimamura, Tokyo, JP;

Hiromichi Yamada, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); H03K 19/177 (2006.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 11/073 (2013.01); G06F 11/0727 (2013.01); G06F 11/0751 (2013.01); G06F 11/0754 (2013.01); G06F 11/0772 (2013.01); G06F 11/0793 (2013.01); H03K 19/1776 (2013.01); H03K 19/17764 (2013.01);
Abstract

The present invention aims to provide a programmable device with a configuration memory that can hold the state of the occurrence abnormal situation that is difficult to assume such as a failure occurring in the programmable device due to the terrestrial radiation of the configuration memory, even during power off, in order to improve the reproducibility in device testing based on the held error information. The programmable device with the configuration memory includes: an error detection section for detecting an error in the configuration memory, and outputting the detected error as well as an address in which the error occurred, as error information; and an error information holding section provided with a non-volatile memory to store the output error information.


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