The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 09, 2018
Filed:
Mar. 30, 2016
Applicant:
Emc Corporation, Hopkinton, MA (US);
Inventors:
David Meiri, Cambridge, MA (US);
Yuval Harduf, Yehud, IL;
Xiangping Chen, Sherborn, MA (US);
Tal Ben-Moshe, Kiryat Ono, IL;
Philip Love, San Jose, CA (US);
Assignee:
EMC IP HOLDING COMPANY LLC, Hopkinton, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0619 (2013.01); G06F 3/065 (2013.01); G06F 3/067 (2013.01); G06F 3/0647 (2013.01); G06F 3/0652 (2013.01);
Abstract
Described embodiments may provide systems and processes for migrating a replica hierarchy from at least one source device to at least one target device in a storage system. A configuration of the replica hierarchy is migrated, one or more internal nodes of the replica hierarchy are migrated, and one or more leaf nodes of the replica hierarchy are migrated. A cutover operation is performed by deactivating the at least one source device associated with the included replica hierarchy.