The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 09, 2018

Filed:

Jan. 13, 2016
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-Do, KR;

Inventors:

Jae-Sung Yu, Seoul, KR;

Kui-Yon Mun, Hwaseong-si, KR;

Youngwook Kim, Hwaseong-si, KR;

Assignee:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/00 (2006.01); G06F 3/06 (2006.01); G06F 13/16 (2006.01); G11C 29/56 (2006.01); G11C 29/02 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0611 (2013.01); G06F 3/0619 (2013.01); G06F 3/0655 (2013.01); G06F 3/0688 (2013.01); G06F 13/1689 (2013.01); G11C 29/021 (2013.01); G11C 29/023 (2013.01); G11C 29/028 (2013.01); G11C 29/56004 (2013.01);
Abstract

A storage device includes a memory device configured to store data and a memory controller connected to the memory device through a data strobe line and a plurality of data lines. The storage device adds a predetermined specific pattern in front of data and processes data input following the specific pattern as valid data during a read or write operation. The specific pattern is provided in alignment with a data strobe signal (DQS) latency cycle. The memory controller detects a specific pattern input from the memory device during a read operation and processes data input following the specific pattern as valid data when the detected specific pattern matches an internally stored specific pattern.


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