The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 09, 2018
Filed:
Jun. 27, 2016
Commissariat a L'energie Atomique ET Aux Energies Alternatives, Paris, FR;
Centre National DE LA Recherche Scientifique, Paris, FR;
Pierre-Antoine Frugier, Sceaux, FR;
Patrick Mercier, Orsay, FR;
Pierre Chavel, Orsay, FR;
Francois Goudail, Palaiseau, FR;
Abstract
A method of designing an imaging system including an optical system having a longitudinal optical axis, an image sensor and a spatial filter, the imaging system being configured to form an image of a focusing plane on the image sensor. The optical transfer function of the optical system combined with the spatial filter is calculated as a function of the image spatial frequencies, and of the focusing defect (Ψ), so as to determine a contrast map and a phase map of the optical system combined with the pupil function of the spatial filter, the contrast map and the phase map being a function, of the spatial frequency (f), and of the focusing defect (Ψ), and it is determined, based on these maps, a value of longitudinal extension (|P|) of the imaging system focusing depth domain in the useful range of spatial frequencies ([−fc; fc]) and an average contrast.