The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 09, 2018
Filed:
Nov. 20, 2015
Apple Inc., Cupertino, CA (US);
Henry H. Yang, Los Gatos, CA (US);
Jian Guo, Milpitas, CA (US);
APPLE INC., Cupertino, CA (US);
Abstract
Systems, methods, and computer-readable media for calibrating the offset of a magnetometer assembly with reduced power are provided. In one embodiment, a method for operating an assembly may include determining a difference between a current signal measurement output component of a first magnetometer sensor and a previous signal measurement output component of the first magnetometer sensor, comparing the determined difference with a current threshold value, and generating an assembly output based on the comparing, where, when the determined difference is greater than the current threshold value, the generating may include providing a first assembly output using a current offset output component of a second magnetometer sensor, and, when the determined difference is less than the current threshold value, the generating may include providing a second assembly output using a previous offset output component of the second magnetometer sensor.