The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 09, 2018

Filed:

Mar. 02, 2016
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Sandeep R. Bahl, Palo Alto, CA (US);

Grant L. Smith, Fremont, CA (US);

Daniel Ruiz Flores, San Jose, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 27/02 (2006.01); G01R 15/04 (2006.01); G01R 19/00 (2006.01); G01R 31/26 (2014.01);
U.S. Cl.
CPC ...
G01R 27/02 (2013.01); G01R 15/04 (2013.01); G01R 19/0084 (2013.01); G01R 31/2621 (2013.01); G01R 31/2639 (2013.01); G01R 31/2617 (2013.01);
Abstract

Disclosed examples include systems to determine an on-state impedance of a high voltage transistor, and measurement circuits to measure the drain voltage of a drain terminal of the high voltage transistor during switching, including an attenuator circuit to generate an attenuator output signal representing a voltage across the high voltage transistor when the high voltage transistor is turned on, and a differential amplifier to provide an amplified sense voltage signal according to the attenuator output signal. The attenuator circuit includes a clamp transistor coupled with the drain terminal of the high voltage transistor to provide a sense signal to a first internal node, a resistive voltage divider circuit to provide the attenuator output signal based on the sense signal, and a first clamp circuit to limit the sense signal voltage when the high voltage transistor is turned off.


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