The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 09, 2018

Filed:

May. 24, 2013
Applicant:

Tokyo Women's Medical University, Shinjuku-ku, JP;

Inventors:

Nobuyuki Tanaka, Shinjuku-ku, JP;

Ryohei Uchida, Nabari, JP;

Makoto Kondo, Shinjuku-ku, JP;

Masayuki Yamato, Shinjuku-ku, JP;

Teruo Okano, Shinjuku-ku, JP;

Makoto Kaneko, Suita, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 33/483 (2006.01); G01N 13/00 (2006.01); G01N 13/02 (2006.01);
U.S. Cl.
CPC ...
G01N 33/4833 (2013.01); G01N 13/00 (2013.01); G01N 13/02 (2013.01); G01N 2013/0208 (2013.01);
Abstract

Provided is a means for evaluating the wetting characteristic of an object such as a cell sheet and a culture dish in a non-contact fashion. The wetting characteristic of an object is evaluated by a method comprising the steps of: (1) removing a liquid by jetting a gas at a surface of the object covered with the liquid, (2) measuring a dimension of a region in which the liquid is removed after the completion of the gas jetting and (3) evaluating the wetting characteristic of the object using the measured dimension as an index.


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