The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 09, 2018
Filed:
Dec. 09, 2016
The Boeing Company, Chicago, IL (US);
Jeffrey G. Thompson, Tacoma, WA (US);
Gary E. Georgeson, Tacoma, WA (US);
Hong Hue Tat, Redmond, WA (US);
Tyler M. Holmes, Seattle, WA (US);
The Boeing Company, Chicago, IL (US);
Abstract
Methods for identifying and quantifying wrinkles in a composite structure by processing infrared image data. The intensity and first and second time derivatives thereof at a particular time can be displayed as thermography line profiles on a graph in which the horizontal axis represents the pixel number across the field of view of an infrared camera. The spatial derivatives of the foregoing thermography line profiles can also be calculated and displayed as a graph. The maximum amplitude (i.e., height) of an out-of-plane wrinkle can be determined using a correlation/calibration curve that is constructed by correlating infrared image data with optical measurement data. In addition, the wavelength and maximum amplitude of an in-plane wrinkle can be measured directly from the thermography line profiles.