The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 09, 2018

Filed:

Jul. 22, 2015
Applicant:

Panasonic Intellectual Property Management Co., Ltd., Osaka, JP;

Inventors:

Keiji Hirata, Fukuoka, JP;

Yuuji Terashima, Fukuoka, JP;

Kazuhiro Yanagi, Fukuoka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/31 (2006.01); G01N 21/27 (2006.01); G01V 8/10 (2006.01); G01N 21/35 (2014.01); G01S 17/10 (2006.01); G01S 17/42 (2006.01); G01S 17/88 (2006.01); G01N 21/25 (2006.01); G01N 21/47 (2006.01); G01N 21/17 (2006.01);
U.S. Cl.
CPC ...
G01N 21/3151 (2013.01); G01N 21/256 (2013.01); G01N 21/27 (2013.01); G01N 21/35 (2013.01); G01N 21/47 (2013.01); G01S 17/10 (2013.01); G01S 17/42 (2013.01); G01S 17/88 (2013.01); G01V 8/10 (2013.01); B60T 2210/10 (2013.01); G01N 2021/1793 (2013.01); G01N 2021/3155 (2013.01); G01N 2201/101 (2013.01);
Abstract

A substance detection sensor includes a first light source, a second light source, and a substance detector. The first light source irradiates a detection area including a plurality of target areas with reference light having a first wavelength through surface irradiation using optical scanning. The second light source irradiates the detection area with first measuring light having a second wavelength different from the first wavelength through the surface irradiation using the optical scanning. The substance detector detects a specific substance in the detection area based on reflection light of the reference light from the first light source and reflection light of the first measuring light from the second light source.


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