The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 09, 2018
Filed:
Feb. 21, 2017
Osaka City University, Osaka, JP;
Souichi Saeki, Osaka, JP;
OSAKA CITY UNIVERSITY, Osaka, JP;
Abstract
A control computation unit causes an optical modulator to change a polarization state to shift a phase of polarized light with which an object is irradiated, computes a spatial gradient of tomographic distribution of phase difference of an interference signal on the basis of phase differences of interference signals each obtained by each phase shift of the polarized light, and visually displays tomographic distribution of spatial gradient in association with tomographic distribution of stress on the display device. The control computation unit computes deformation rate vector distribution at cross-sectional positions of the object on the basis of optical interference signals, and further computes tomographic distribution of strain rate tensor. The control computation unit then computes tomographic distribution of mechanical property value from the tomographic distribution of stress and the tomographic distribution of strain rate tensor, and visually displays the tomographic distribution of mechanical property value.