The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 09, 2018
Filed:
Mar. 23, 2016
General Electric Company, Schenectady, NY (US);
Guanghua Wang, Clifton Park, NY (US);
Bin Ma, Clifton Park, NY (US);
James Peter DeLancey, Corinth, NY (US);
K. M. K. Genghis Khan, Niskayuna, NY (US);
Carlos Bonilla Gonzalez, Cohoes, NY (US);
Robert David Briggs, West Chester, OH (US);
Nirm Velumylum Nirmalan, Liberty Township, OH (US);
GENERAL ELECTRIC COMPANY, Schenectady, NY (US);
Abstract
A temperature measurement system includes at least one temperature measurement probe. The at least one temperature measurement probe includes at least one hollow filament configured to emit thermal radiation in a predetermined and substantially continuous wavelength band at least partially representative of a temperature of the at least one hollow filament. The at least one hollow filament has a first diameter and a first emissivity. The at least one temperature measurement probe also includes at least one thin filament extending within at least a portion of the at least one hollow filament. The at least one thin filament is configured to emit thermal radiation in a predetermined and substantially continuous wavelength band at least partially representative of a temperature of the at least one thin filament. The at least one thin filament has a second emissivity and a second diameter less than the first diameter.