The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 09, 2018

Filed:

Dec. 22, 2014
Applicants:

Hidefumi Akiyama, Tokyo, JP;

National Institute of Advanced Industrial Science and Technology, Tokyo, JP;

Atto Corporation, Tokyo, JP;

Inventors:

Hidefumi Akiyama, Tokyo, JP;

Masahiro Yoshita, Tokyo, JP;

Yoshihiro Ohmiya, Tsukuba, JP;

Hidehiro Kubota, Tokyo, JP;

Kaneo Mori, Tokyo, JP;

Masahiro Shimogawara, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/00 (2006.01); G01J 1/42 (2006.01); G01K 13/00 (2006.01); H05B 33/08 (2006.01); G02B 5/20 (2006.01); H01L 33/62 (2010.01); H01L 33/42 (2010.01); H01L 33/44 (2010.01); H01L 27/15 (2006.01);
U.S. Cl.
CPC ...
G01J 1/4228 (2013.01); G01K 13/00 (2013.01); G02B 5/205 (2013.01); H01L 27/153 (2013.01); H01L 33/42 (2013.01); H01L 33/44 (2013.01); H01L 33/62 (2013.01); H05B 33/0854 (2013.01); H05B 33/0863 (2013.01);
Abstract

A light-emitting element, in which a light whose emission angle distribution is one of Lambert's emission law or uniform Isotropic emission, is extracted from a light extraction opening window, and an in-plane distribution of a light intensity on a light extraction surface of the light extraction opening window is uniform, and which can be used as a reference light source when measuring an absolute light quantity of a weak light emitted from a luminous body which is a measurement object.


Find Patent Forward Citations

Loading…