The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 09, 2018
Filed:
Sep. 06, 2011
Shigeru Ichihara, Tokyo, JP;
Shuichi Kobayashi, Yokohama, JP;
Shigeru Ichihara, Tokyo, JP;
Shuichi Kobayashi, Yokohama, JP;
CANON KABUSHIKI KAISHA, Tokyo, JP;
Abstract
A photoacoustic wave measuring apparatus, having: a probe including a plurality of devices which detect an acoustic wave generated by irradiating light onto an object; and a signal processor which acquires information about the object on the basis of an acoustic wave received by the devices, wherein the light is irradiated onto the object from the probe side; the probe includes: bright-field devices having a view angle covering a bright-field illumination area, which is an area where the light is irradiated, on the probe-side surface of the object; and dark-field devices having a field of view which does not cover the bright-field illumination area; and the signal processor uses an acoustic wave received by the dark-field devices when acquiring information about the object on the basis of a acoustic wave received before a predetermined time period is elapsed since the irradiation of light onto the object.