The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 09, 2018
Filed:
Dec. 09, 2015
International Business Machines Corporation, Armonk, NY (US);
Ehud Aharoni, Kfar Saba, IL;
Upendra D. Chitnis, New York, NY (US);
Levente Klein, Tuckahoe, NY (US);
Yehuda Naveh, Haifa, IL;
International Business Machines Corporation, Armonk, NY (US);
Abstract
Techniques for using a scaling relationship between crop drymass and elevation at a farm level to redistribute crop yield data are provided. In one aspect, a method for analyzing crop yield is provided. The method includes the steps of: obtaining crop yield data for a farm; cleansing the crop yield data using a data filter(s), wherein one or more data points are eliminated from the crop yield data by the data filter; and redistributing a value of the data points eliminated from the crop yield data to data points remaining in the crop yield data to create a crop yield distribution for the farm.