The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2018
Filed:
Dec. 28, 2015
Metal Industries Research & Development Centre, Kaohsiung, TW;
Chia-Ming Jan, Kaohsiung, TW;
Chung-Li Tsai, Kaohsiung, TW;
Po-Chi Hu, Kaohsiung, TW;
Chao-Yung Yeh, Kaohsiung, TW;
Chi-Cheng Yang, Kaohsiung, TW;
Metal Industries Research & Development Centre, Kaohsiung, TW;
Abstract
Device and method for scanning an object outline image are provided. The scanning device includes a light source, an optical sensor and a processor. The scanning method includes: providing a polarized projection light beam; projecting the polarized projection light beam to an object, and correspondingly reflecting a polarized reflection light beam by the object according to the polarized projection light beam; capturing an image of the polarized reflection light beam; calculating polarization state of target according to the polarized projection light beam and the polarized reflection light beam, the polarization state of target having a plane angle from normal projection and a corresponding point position; and restoring an outline image of the object according to the polarization state of target.