The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 02, 2018

Filed:

Sep. 22, 2015
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Tetsuri Sonoda, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/232 (2006.01); H04N 9/31 (2006.01); G06T 7/521 (2017.01);
U.S. Cl.
CPC ...
H04N 9/31 (2013.01); G06T 7/521 (2017.01);
Abstract

An image processing apparatus can measure a three-dimensional shape of a subject with high accuracy when an image of a projection pattern is captured with a favorable contrast. The image processing apparatus includes a matching calculation unit that performs matching calculation between a projection pattern in an image being captured and an image of a projection pattern generated by a projection pattern generation unit. An image evaluation unit calculates a contrast as an evaluation standard in the captured image. A symbol position calculation unit highly accurately calculates a position of each of a group of points forming the projection pattern, for each area in the captured image determined to be a highly accurate shape measurable area based on the contrast, and thus obtains a peak luminance position. A three-dimensional shape calculation unit calculates the three-dimensional shape of the subject.


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