The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10090914 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 02, 2018

Filed:

Oct. 13, 2015
Applicant:

Fluke Corporation, Everett, WA (US);

Inventors:

J. David Schell, Austin, TX (US);

Christian Schillab, Brunn am Gebirge, AT;

Assignee:

Fluke Corporation, Everett, WA (US);

Attorney:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); H04B 10/073 (2013.01); G01B 9/04 (2006.01); G01N 21/952 (2006.01); G06K 9/00 (2006.01); G01M 11/00 (2006.01);
U.S. Cl.
CPC ...
H04B 10/073 (2013.01); G01B 9/04 (2013.01); G01M 11/31 (2013.01); G01N 21/952 (2013.01); G06K 9/00 (2013.01);
Abstract

One or more embodiments are directed to apparatuses and methods of evaluating an endface of an optical communication link, such as a fiber optic cable. In at least one embodiment, a camera probe includes an imaging device that includes one or more feedback mechanisms, such as an alignment feedback mechanism that communicates alignment information regarding an alignment of the optical communication link under test with an image sensor of the camera probe. The alignment feedback mechanism may be visual and/or aural. The alignment feedback mechanism may provide directional information to the user indicative of a direction to move the imaging device relative to the optical communication link. In addition or alternatively, the feedback mechanism may include a focus feedback mechanism that communicates focus information regarding a focus of the endface in an obtained image of the endface.


Find Patent Forward Citations

Schell, J.. (2018). Test probes for smart inspection (U.S. Patent No. 10090914). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10090914

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