The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2018
Filed:
Jan. 11, 2018
National Institute of Metrology, China, Beijing, CN;
Beijing University of Chemical Technology, Beijing, CN;
Chenguang Cai, Beijing, CN;
Ming Yang, Beijing, CN;
Other;
Abstract
The present disclosure discloses a method for performing an ADC phase-frequency response test including: measuring a time delay of an analog mixer and low-pass filter (MLPF) in down-converting a specific carrier frequency narrowband frequency modulation (FM) signal; determining an effective sampling frequency required by an ADC for acquiring FM signals; acquiring a high carrier frequency FM signal and a low carrier frequency FM signal before and after down-conversion is performed by the analog MLPF; and demodulating the FM signals that are acquired, correcting an initial phase of a modulation signal of the high carrier frequency FM signal and an initial phase of a modulation signal of the low carrier frequency FM signal, and calculating a phase-frequency response of the ADC at a high carrier frequency. The present disclosure has advantages of a simple test process, a wide frequency range with frequencies and a test simultaneously performed on multiple channels.