The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2018
Filed:
Apr. 26, 2017
National Institutes for Quantum and Radiological Science and Technology, Chiba-shi, JP;
Toshiba Energy Systems & Solutions Corporation, Kawasaki-shi, JP;
Takuji Furukawa, Chiba, JP;
Shigeki Takayama, Yokohama, JP;
Takashi Yazawa, Ota, JP;
Yoshiharu Kanai, Yokohama, JP;
Kosuke Sato, Kamakura, JP;
Tomofumi Orikasa, Yokohama, JP;
Kei Koyanagi, Yokohama, JP;
NATIONAL INSTITUTES FOR QUANTUM AND RADIOLOGICAL SCIENCE AND TECHNOLOGY, Chiba-shi, JP;
TOSHIBA ENERGY SYSTEMS & SOLUTIONS CORPORATION, Kawasaki-shi, JP;
Abstract
A charged particle beam irradiation apparatus according to an embodiment includes: a first scanning electromagnet device configured to deflect a charged particle beam to a second direction that is substantially perpendicular to a first direction along which the charged particle beam enters, the first scanning electromagnet device having an aperture on an outlet side larger than that on an inlet side; and a second scanning electromagnet device configured to deflect the charged particle beam to a third direction that is substantially perpendicular to the first direction and the second direction, the second scanning electromagnet device having an aperture on an outlet side larger than that on an inlet side, the first scanning electromagnet device and the second scanning electromagnet device being disposed to be parallel with the first direction.