The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2018
Filed:
Mar. 26, 2015
Konica Minolta Laboratory U.s.a., Inc., San Mateo, CA (US);
John Randall Christ, Santa Clara, CA (US);
Po-Chieh Hung, Cupertino, CA (US);
Konica Minolta Laboratory U.S.A., Inc, San Mateo, CA (US);
Abstract
A method, a computer program product, and a system are disclosed for stitching aerial data using information from at least one previous image. The method includes capturing a plurality of images of the landscape; obtaining, image metadata for each of the captured images; generating, for each of the captured images, a set of transformed images based on the image metadata, comprises: setting a variable for each of the parameters; preparing a plurality of sets of transformed image metadata by applying the variables to the parameters; and preparing the set of transformed images from the captured image based on the plurality of sets of transformed image metadata, respectively; identifying, for each set of transformed images, one of the transformed images by calculating quality of fit to the top level image for each of the transformed images; and assembling a new aerial image based on the plurality of the identified transformed images.