The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 02, 2018

Filed:

Jul. 01, 2015
Applicant:

Mapillary Ab, Malmö, SE;

Inventors:

Jan Erik Solem, Bjärred, SE;

Yubin Kuang, Lund, SE;

Johan Gyllenspetz, West Hollywood, CA (US);

Peter Neubauer, Malmö, SE;

Assignee:

MAPILLARY AB, , SE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 11/20 (2006.01); G06F 17/30 (2006.01); H04N 7/18 (2006.01); G06K 9/46 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06T 11/206 (2013.01); G06F 17/3002 (2013.01); G06F 17/30061 (2013.01); G06F 17/30259 (2013.01); G06F 17/30958 (2013.01); G06K 9/4604 (2013.01); G06K 9/6267 (2013.01); H04N 7/185 (2013.01);
Abstract

A method for navigating through a set of images depicting a scene comprises providing a graph representation of correlations of the images and receiving input for navigation that includes an indication of a current image and weight information to control weights to be given to a plurality of measures of similarities of edges in the graph. The indication of the current image is used to determine a current node in the graph representation. At least one best ranked transition image is determined related to the current image by an edge from the current node, said determining comprising using the weight information to weigh the plurality of measures of similarities for forming a combined measure of similarity for edges from the current node, and selecting the at least one best ranked transition image based on a comparison of the combined measure of similarity for the edges from the current node.


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