The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 02, 2018

Filed:

Feb. 12, 2018
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Sahana H. Anantharajaiah, Bangalore, IN;

Harjindersingh G. Mistry, Bangalore, IN;

Ajay M. Patil, Sydney, AU;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 17/18 (2006.01); G06F 17/17 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30466 (2013.01); G06F 17/18 (2013.01); G06F 17/30292 (2013.01); G06F 17/175 (2013.01);
Abstract

In one embodiment, a method for improving cardinality estimation of a join predicate between a fact table and an overloaded dimension table is provided. The method includes receiving a dimension table and a fact table in a join predicate of one or more SQL statements. The method further includes identifying a majority of records in the fact table that refer to a subset of records in the dimension table. The method further includes computing a filter factor of the join predicate between the dimension table and the fact table. The method further includes creating a statistical view using one or more relevant portions of the dimension table that are referred to by the fact table.


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