The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 02, 2018

Filed:

Aug. 23, 2016
Applicant:

Electronics and Telecommunications Research Institute, Daejeon, KR;

Inventors:

Soo Jong Lim, Daejeon-si, KR;

Hyun Ki Kim, Daejeon-si, KR;

Sang Kyu Park, Daejeon-si, KR;

Yong Jin Bae, Daejeon-si, KR;

Chung Hee Lee, Daejeon-si, KR;

Hyung Jik Lee, Daejeon-si, KR;

Joon Ho Lim, Daejeon-si, KR;

Myung Gil Jang, Daejeon-si, KR;

Mi Ran Choi, Daejeon-si, KR;

Jeong Heo, Daejeon-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/27 (2006.01); G10L 15/01 (2013.01); G10L 15/32 (2013.01);
U.S. Cl.
CPC ...
G06F 17/2785 (2013.01); G06F 17/2705 (2013.01); G06F 17/278 (2013.01); G06F 17/2755 (2013.01); G10L 15/01 (2013.01); G10L 15/32 (2013.01);
Abstract

An apparatus for amending a language analysis error includes: a main language analyzer, which includes a plurality of language processing modules being sequentially connected to each other, and generates one best main analysis result for each processing module; a subsidiary language analyzer, which includes the plurality of language processing modules, and generates a plurality of subsidiary analysis results for each of the plurality of language processing modules; and an analysis result amender to in response to an error occurring in the main analysis result, acquire a subsidiary analysis result, and transmit the subsidiary analysis result to the main language analyzer.


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