The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2018
Filed:
Feb. 01, 2016
Siemens Aktiengesellschaft, Munich, DE;
Patrick Heiler, Waghaeusel, DE;
Bernd-Markus Pfeiffer, Woerth, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
A diagnostic device and method for monitoring the operation of a slave or ratio control loop in a meshed control structure of an automation system. The diagnostic device includes an evaluation device and a data memory for storing sequences of setpoint data and actual value data. The evaluation device determines a first dimension for the scatter of the actual-value data and a second dimension for the scatter of the setpoint data. A characteristic number (CPI, CPI) for evaluating control quality is determined and/or displayed as a function of the ratio of the first dimension to the second dimension to enable an operator to evaluate the control loop status, permitting automated control loop evaluation of a fluctuating setpoint.