The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2018
Filed:
Dec. 09, 2015
Farnoud Kazemzadeh, Waterloo, CA;
Alexander Sheung Lai Wong, Waterloo, CA;
Farnoud Kazemzadeh, Waterloo, CA;
Alexander Sheung Lai Wong, Waterloo, CA;
Other;
Abstract
There is disclosed a novel system and method for achieving ultra-resolution, ultra-wide field-of-view multispectral and hyperspectral holographic microscopy and quantitative phase contrast microscopy. In an embodiment, the method comprises: providing a stationary illumination source; acquiring a plurality of low-resolution holograms of an image subject from different locations utilizing a subpixel sensor-scanning synthetic aperture mechanism whereby a detector scanning translationally, radially and/or rotationally; processing the acquired holograms utilizing a processing algorithm corresponding to the scanning motion of the detector used to acquire the holograms; and reconstructing a subpixel ultra-resolution image of the image subject based on the processed holograms; whereby, a desired synthetic aperture is achieved without loss of resolution. The multispectral and hyperspectral aspect is achieved in the novel system and method by use of different combination of illumination sources (i.e., LEDs, laser sources, broadband lamps, etc.) and wavelength selection mechanisms (i.e., bandpass spectral filters, acousto-optical and liquid crystal tunable filters, a dispersing element, etc.).