The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2018
Filed:
Aug. 29, 2014
Uniwersytet Jagiellonski, Crakow, PL;
Pawel Moskal, Czulowek, PL;
UNIWERSYTET JAGIELLONSKI, Krakow, PL;
Abstract
A method for determining parameters of reaction of a gamma quantum within a scintillation detector of a PET scanner, wherein the signal measured by the scintillator is transformed in at least one photomultiplier into an electric measured signal. The method comprises obtaining an access to a database () comprising reference standard signals (W) and reaction parameters assigned to the reference standard signals (W); comparing the measured signal (S) to the reference standard signals (W) and selecting the reference standard signal (W) that best fits the measured signal (S); assigning to the measured signal (S) the reaction parameters assigned to the selected best-fitting reference standard signal (W), as parameters of the reaction of the gamma quantum within the scintillation detector () for the measured signal (S); wherein the measured signal (S) and the reference standard signals (W) are represented by points (P) within a generalized measurement space (Ωp) having a number of dimensions (N measurements) being equal to the total number of measurements performed for that gamma quantum.