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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10088460 B1

PDFFull Text
Date of Patent:
Oct. 02, 2018

Filed:

Oct. 28, 2011

Automated system for sample preparation and analysis

Applicants:

Robert Dewitte, Burlington, CA;

Juhani Siidorov, Vantaa, FI;

Vesa Nuotio, Espoo, FI;

Raimo Salminen, Helsinki, FI;

Jarmo Vehkomaki, Veikkola, FI;

Jukka Saukkonen, Espoo, FI;

Bill Ostman, Helsinki, FI;

Joseph M. Senteno, San Jose, CA (US);

John Edward Brann, Iii, Shrewsbury, MA (US);

Joseph L. Herman, West Chester, PA (US);

Jeffrey A. Zonderman, Westwood, MA (US);

Terry N. Olney, Tracy, CA (US);

Inventors:

Robert DeWitte, Burlington, CA;

Juhani Siidorov, Vantaa, FI;

Vesa Nuotio, Espoo, FI;

Raimo Salminen, Helsinki, FI;

Jarmo Vehkomaki, Veikkola, FI;

Jukka Saukkonen, Espoo, FI;

Bill Ostman, Helsinki, FI;

Joseph M. Senteno, San Jose, CA (US);

John Edward Brann, III, Shrewsbury, MA (US);

Joseph L. Herman, West Chester, PA (US);

Jeffrey A. Zonderman, Westwood, MA (US);

Terry N. Olney, Tracy, CA (US);

Assignee:

THERMO FISHER SCIENTIFIC OY, Vantaa, FI;

Attorney:

Thompson Hine LLP

Primary Examiner:

Shogo Sasaki

Int. Cl.
CPC ...
G01N 30/72 (2006.01); G01N 30/06 (2006.01); G01N 30/86 (2006.01); G01N 35/00 (2006.01); G01N 35/02 (2006.01); G01N 35/08 (2006.01); G01N 27/62 (2006.01); H01J 49/04 (2006.01); H01J 49/00 (2006.01); H01J 49/10 (2006.01); G01N 30/88 (2006.01); G01N 30/16 (2006.01); G01N 30/02 (2006.01); G01N 30/62 (2006.01);
U.S. Cl.
CPC ...
G01N 30/7233 (2013.01); G01N 27/62 (2013.01); G01N 30/06 (2013.01); G01N 30/16 (2013.01); G01N 30/72 (2013.01); G01N 30/8658 (2013.01); G01N 30/88 (2013.01); G01N 35/0092 (2013.01); G01N 35/00871 (2013.01); G01N 35/026 (2013.01); G01N 35/08 (2013.01); H01J 49/0031 (2013.01); H01J 49/0413 (2013.01); H01J 49/0431 (2013.01); H01J 49/10 (2013.01); G01N 2030/027 (2013.01); G01N 2030/067 (2013.01); G01N 2030/628 (2013.01); G01N 2030/8804 (2013.01); G01N 2030/8813 (2013.01); H01J 49/00 (2013.01); H01J 49/0409 (2013.01); Y10T 436/24 (2015.01);
Abstract

A sample preparation and analysis system. The systemincludes a sample preparation systemand a sample analysis system. The sample preparation systemprepares samples in accordance with an assay that is selected from a database containing a plurality of unique assays. The sample analysis systemincludes an analyzerthat is dynamically reconfigurable based on the selected assay so as to analyze the prepared sample in accordance with that selected assay. A data communication linkcommunicates data from the sample preparation systemto the sample analysis systemto reconfigure the analyzerin accordance with the selected assay.

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