The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 02, 2018

Filed:

Dec. 24, 2013
Applicant:

Posco, Pohang-si, Gyeongsangbuk-do, KR;

Inventors:

Ju-Seung Lee, Pohang-si, KR;

Chang-Hyun Park, Pohang-si, KR;

Geon Shin, Pohang-si, KR;

Sang-Woo Choi, Pohang-si, KR;

Shin-Hwan Kang, Gwangyang-si, KR;

Ho-Moon Bae, Pohang-si, KR;

Ki-Jang Oh, Pohang-si, KR;

Assignee:

POSCO, Pohang-si, Gyeongsangbuk-do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/82 (2006.01);
U.S. Cl.
CPC ...
G01N 27/82 (2013.01);
Abstract

An aspect of the present disclosure may provide a defect detection apparatus and method for a steel plate, in which a defect in a steel plate may be detected, and particularly, only an inner defect in the steel plate may be detected, even with a relatively low amplification rate.


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