The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2018
Filed:
Jul. 20, 2016
Crystalvue Medical Corporation, Taoyuan, TW;
William Wang, Taoyuan, TW;
Meng-Shin Yen, Taipei, TW;
Chung-Cheng Chou, Luzhu Township, TW;
Chung-Ping Chuang, Taoyuan, TW;
Crystalvue Medical Corporation, Taoyuan, TW;
Abstract
A measurement apparatus used to measure an object is disclosed. The measurement apparatus includes at least one sensing unit, a first optical module, a second optical module, a data processing unit and at least one prompting unit. The at least one sensing unit is disposed near the object to perform a contact or proximity sensing on the object. The first optical module is disposed near the object and adjacent to the at least one sensing unit. The first optical module includes at least one lens unit. The second optical module and the object are disposed at opposite sides of the first optical module. The second optical module includes a light source and at least one optical component. The data processing unit is coupled to at least one sensing unit. The at least one prompting unit is coupled to the data processing unit.