The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2018
Filed:
May. 08, 2015
Danmarks Tekniske Universitet, Lyngby, DK;
Anders Kristensen, Frederiksberg C, DK;
Christoph Vannahme, Charlottenlund, DK;
Martin Dufva, Hornbæk, DK;
Danmarks Tekniske Universitet, Lyngby, DK;
Abstract
A surface refractive index acquisition system for characterization of a sample is provided. The system comprises a grating device configured to receive the sample, and first and second grating regions. First and second grating periods are selected to provide optical resonances for light respectively in first and second wavelength bands. A light source is configured to illuminate part of the first and second grating regions simultaneously. An imaging system is configured to image light from the grating device and comprises an optical element focusing light in a transverse direction and being invariant in an orthogonal transverse direction, the optical element being oriented such that the longitudinal direction of the grating device is oriented to coincide with the invariant direction of the optical element, and an imaging spectrometer comprising an entrance slit having a longitudinal direction oriented to coincide with the invariant direction of the optical element.