The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2018
Filed:
Jun. 19, 2015
Applicant:
Tsi, Incorporated, St. Paul, MN (US);
Inventors:
Steven G. Buckley, Redmond, WA (US);
Darrick L. Niccum, Vadnais Heights, MN (US);
Assignee:
TSI, Incorporated, Shoreview, MN (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B07C 5/00 (2006.01); G01N 21/71 (2006.01); B07C 5/342 (2006.01); B07C 5/36 (2006.01); G01J 3/443 (2006.01);
U.S. Cl.
CPC ...
G01N 21/718 (2013.01); B07C 5/3425 (2013.01); B07C 5/365 (2013.01); B07C 2501/0018 (2013.01); B07C 2501/0036 (2013.01); G01J 3/443 (2013.01);
Abstract
A LIBS measurement system is described herein that provides an orifice, aperture or opening in a substantially V-shaped chute or sleeve that allows access to the material to be analyzed from the underside of the chute. The laser beam is aimed through the hole and return light (signal) is collected through the hole by a photodetector assembly. A diverter device, which is located at an output end of the chute, diverts certain particles away from the chute upon receipt of an actuation signal.