The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2018
Filed:
Aug. 28, 2015
Tsinghua University, Beijing, CN;
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
Wen-Yun Wu, Beijing, CN;
Jing-Ying Yue, Beijing, CN;
Xiao-Yang Lin, Beijing, CN;
Qing-Yu Zhao, Beijing, CN;
Kai-Li Jiang, Beijing, CN;
Shou-Shan Fan, Beijing, CN;
Tsinghua University, Beijing, CN;
HON HAI PRECISION INDUSTRY CO., LTD., New Taipei, TW;
Abstract
A method for assigning chirality of carbon nanotube is provided. Firstly, carbon nanotube sample, an optical microscope with a liquid immersion objective and a liquid are provided. Secondly, the carbon nanotube sample is immersed in the liquid. Thirdly, the carbon nanotube sample is illuminated by an incident beam to generate resonance Rayleigh scattering. Forthly, the liquid immersion objective is immersed into the liquid to get a resonance Rayleigh scattering (RRS) image of the carbon nanotube sample. Fifthly, spectra of the carbon nanotube sample are measured to obtain chirality of the carbon nanotube sample.