The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2018
Filed:
Sep. 02, 2015
Applicant:
Ramot AT Tel-aviv University Ltd., Tel-Aviv, IL;
Inventors:
Ori Cheshnovsky, RaAnana, IL;
Omer Tzang, Tel-Aviv, IL;
Assignee:
Ramot at Tel-Aviv University Ltd., Tel-Aviv, IL;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/46 (2006.01); G01N 21/63 (2006.01); G01N 21/17 (2006.01); G01N 21/65 (2006.01); G02B 21/06 (2006.01);
U.S. Cl.
CPC ...
G01N 21/636 (2013.01); G01N 21/1717 (2013.01); G01N 21/65 (2013.01); G02B 21/06 (2013.01); G01N 2021/1731 (2013.01);
Abstract
A method of microscopy is disclosed. The method comprises directing a pulse of a pump optical beam to form an optical spot on a substance and measuring changes in a temperature-dependent or photo-excited property of the substance. The method further comprises analyzing the measured changes to distinguish between information pertaining to the property at a portion of the spot, and information pertaining to the property at other portions of the spot. A largest diameter of the portion of the spot is optionally and preferably less than a central wavelength of the pump optical beam.