The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2018
Filed:
Nov. 18, 2015
Hyundai Motor Company, Seoul, KR;
Pusan National University Industry—university Cooperation Foundation, Busan, KR;
Jung Yeon Park, Gyeonggi-Do, KR;
Woong Pyo Hong, Seoul, KR;
Ji Youn Seo, Gyeonggi-do, KR;
Bo Kyung Kim, Gyeonggi-do, KR;
In Woong Lyo, Gyeonggi-do, KR;
Kwang Hoon Choi, Gyeonggi-do, KR;
Doo In Kim, Busan, KR;
Sung Mo Park, Busan, KR;
Myung Yung Jeong, Busan, KR;
Hyundai Motor Company, Seoul, KR;
Pusan National University Industry—University Cooperation, Busan, KR;
Abstract
A method of measuring a friction coefficient of a surface of a specimen includes: obtaining surface information of the specimen by using an atomic force microscope (AFM); calculating data of a friction coefficient of the surface of the specimen by using the surface information of the specimen; and mapping the data of the friction coefficient of the specimen to an image. The method of measuring a friction coefficient of a surface of a specimen may prevent a probe part of an atomic force microscope from being worn out and secure high reliability of the friction coefficient value by correcting the atomic force microscope using a specimen to be actually measured and measuring a fiction coefficient at the same time.