logo

For the Inventor, By the Inventor

The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10088376 B1

PDFFull Text
Date of Patent:
Oct. 02, 2018

Filed:

Aug. 07, 2015

Contact pressure measuring apparatus, method of manufacturing the same and method of measuring contact pressure

Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Sangkyu Kim, Yongin-si, KR;

Joonhyung Lee, Yongin-si, KR;

Seongho Cho, Gwacheon-si, KR;

Assignee:

SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;

Attorney:

Sughrue Mion, PLLC

Primary Examiner:

Jonathan Dunlap

Int. Cl.
CPC ...
G01L 1/24 (2006.01); G01N 21/17 (2006.01); G01L 9/00 (2006.01); G06F 3/041 (2006.01); G06F 3/042 (2006.01); G01L 11/02 (2006.01); G01N 23/046 (2018.01); G06F 3/03 (2006.01); G01L 1/25 (2006.01);
U.S. Cl.
CPC ...
G01L 1/24 (2013.01); G06F 3/0414 (2013.01); G06F 3/0421 (2013.01); G01L 1/241 (2013.01); G01L 1/25 (2013.01); G01L 9/0076 (2013.01); G01L 11/02 (2013.01); G01N 23/046 (2013.01); G01N 2021/1787 (2013.01); G01N 2223/419 (2013.01); G06F 3/0325 (2013.01); G06F 3/041 (2013.01); G06F 3/042 (2013.01); G06F 3/0423 (2013.01); G06F 3/0428 (2013.01); G06F 2203/04104 (2013.01); G06F 2203/04109 (2013.01);
Abstract

An apparatus and method for measuring a contact pressure and a method of manufacturing the apparatus. The apparatus includes: a material layer configured to provide a light path along which incident light travels to a subject being in contact with the material layer; a spectrum analyzer configured to detect light emitted from the material layer and perform a light absorption spectrum analysis on the detected light to determine an intensity of the detected light; and a pressure calculator configured to determine the contact pressure of the subject based on the determined intensity.

Find Patent Forward Citations

Kim, Sangkyu. (2018). Contact pressure measuring apparatus, method of manufacturing the same and method of measuring contact pressure (U.S. Patent No. 10088376). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10088376

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…