The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2018
Filed:
Feb. 05, 2016
Applicant:
Instrument Systems Optische Messtechnik Gmbh, Munich, DE;
Inventors:
Assignee:
INSTRUMENT SYSTEMS OPTISCHE MESSTECHNIK GMBH, Munich, DE;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01J 3/50 (2006.01); G01J 3/46 (2006.01); G01J 3/52 (2006.01); G01J 3/02 (2006.01); H04N 9/30 (2006.01); H04N 17/04 (2006.01); G06T 7/90 (2017.01); G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
G01J 3/506 (2013.01); G01J 3/0243 (2013.01); G01J 3/462 (2013.01); G01J 3/465 (2013.01); G01J 3/524 (2013.01); G06K 9/4652 (2013.01); G06K 9/4661 (2013.01); G06T 7/90 (2017.01); H04N 9/30 (2013.01); H04N 17/04 (2013.01); G06K 9/46 (2013.01);
Abstract
The invention relates to a method for two-dimensional, spatially resolved measurement of tristimulus values of light emitted from a plurality of positions on a sample. It is an object of the invention to provide an improved method and system for spatially resolved chromaticity and luminance measurement in a standardized color space for display testing. The method of the invention comprises the steps of: