The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2018
Filed:
Dec. 11, 2017
Applicants:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Imec Taiwan, Hsinchu, TW;
Inventors:
Assignees:
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
IMEC TAIWAN, Hsinchu, TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01); G01J 3/42 (2006.01); G01J 3/10 (2006.01); G01J 3/02 (2006.01); A61B 5/00 (2006.01); A61B 5/1455 (2006.01); A61B 5/145 (2006.01);
U.S. Cl.
CPC ...
G01J 3/42 (2013.01); A61B 5/0075 (2013.01); G01J 3/0208 (2013.01); G01J 3/0243 (2013.01); G01J 3/0291 (2013.01); G01J 3/108 (2013.01); A61B 5/1455 (2013.01); A61B 5/14532 (2013.01); A61B 2560/045 (2013.01);
Abstract
A biometric sensor that measures biometric information and a biometric analysis system including the biometric sensor are provided. The biometric sensor may include: a light source configured to emit light toward a region of interest of an object under examination, the light being diffused at the region of interest; a collimator that includes a though-hole and is configured to collimate the diffused light received from the region of interest; and a spectrometer configure to analyze the diffused light transmitted by the collimator.