The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2018
Filed:
Sep. 09, 2016
Krohne Messtechnik Gmbh, Duisburg, DE;
Michael Gerding, Bochum, DE;
Björn Schäfer, Bochum, DE;
KROHNE Messtechnik GmbH, Duisburg, DE;
Abstract
A measuring arrangement and a measuring device having a sensor device, a processing device, a storage device, an interface and a control device that allows for a simplified testing of the functionality of the measuring device is achieved in that the control device retrieves externally provided data via the interface and performs a test of the measuring device. The test thereby involves the control device determining a reference value from the externally provided data, comparing the reference value to a measured value generated by the processing device and generating a comparison result based thereupon. Alternatively, the test involves the control device using the externally provided data for the generation of new calculation data to be stored in the storage device and storing the new calculation data in the storage device.